1919
Progress in SiC MOSFET Reliability

Tuesday, October 29, 2013: 11:30
Continental 9, Tower 3, Ballroom Level (Hilton San Francisco Union Square)
David R. Hughart , Sandia National Laboratories
Jack D. Flicker , Sandia National Laboratories
Sandeepan DasGupta , Sandia National Laboratories, Albuquerque, NM
Stan Atcitty , Sandia National Laboratories
Robert J. Kaplar , Sandia National Laboratories, Albuquerque, NM
Matthew J. Marinella , Sandia National Laboratories, Albuquerque, NM

Abstract:

See more of: Power Device Reliability 1
See more of: E3: GaN and SiC Power Technologies 3
See more of: Dielectric and Semiconductor Materials, Devices, and Processing
<< Previous Abstract | Next Abstract >>