2010
Temperature Dependent Studies to Understand the Mechanism of Switching in Resistive Random Access Memory Devices

Thursday, October 31, 2013: 08:40
Golden Gate 1, Tower 3, Lobby Level (Hilton San Francisco Union Square)
Branden Long, PhD , University of Toledo
Wenbo Chen, MS , University of Toledo
Yibo Li, MS , University of Toledo
Saptarshi Mandal, B.Tech. , University of Toledo
Gennadi Bersuker, PhD , Sematech Incorporated
David Gilmer, PhD , Sematech Incorporated
Rashmi Jha, PhD , University of Toledo, Toledo, OH

Abstract:

See more of: ReRAM 2
See more of: E5: Nonvolatile Memories
See more of: Dielectric and Semiconductor Materials, Devices, and Processing
<< Previous Abstract | Next Abstract >>