1995
Challenges of Stt-Mram for High Density Memory

Wednesday, October 30, 2013: 14:00
Golden Gate 1, Tower 3, Lobby Level (Hilton San Francisco Union Square)
S. C. Oh , Semiconductor R&D Center, SAMSUNG ElECTRONICS Co., Ltd, Hwasung-City, Gyeonggi-Do, South Korea

Abstract:

  • E5-1995 (148.9KB) - Abstract Text
See more of: STTMRAM 1
See more of: E5: Nonvolatile Memories
See more of: Dielectric and Semiconductor Materials, Devices, and Processing
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