ReRAM 1

Wednesday, October 30, 2013: 10:00-12:00
Golden Gate 1, Tower 3, Lobby Level (Hilton San Francisco Union Square)
Chairs:
Blanka Magyari-Kope and Hisashi Shima
10:00
(Invited) Programmable Metallization Cells in Memory and Switching Applications
Michael N Kozicki, Ph.D., Arizona State University; Pradeep Dandamudi, Arizona State University; Hugh J Barnaby, Ph.D., Arizona State University; Yago Gonzalez-Velo, Ph.D., Arizona State University
10:30
Solid-State Reactions in Resistive Random Access Memory (ReRAM) Induced By Electric Filed and Process Atmosphere
Hisashi Shima, National Institute of Advanced Industrial Science and Technology (AIST); H. Akinaga, AIST
11:00
In Situ TEM Observation of Cu/MoOx ReRAM Switching
Masaki Kudo, Graduate School of Information Science and Technology, Hokkaido University; Yuuki Ohno, Graduate School of Information Science and Technology, Hokkaido University; Kouichi Hamada, Graduate School of Information Science and Technology, Hokkaido University; Masashi Arita, PhD, Graduate School of Information Science and Technology, Hokkaido University; Yasuo Takahashi, PhD, Graduate School of Information Science and Technology, Hokkaido University
11:20
Forming-Free Resistive Switching Characteristics of 15nm Thick Zr-Based Metallic Glass Oxide
Berhanu Tulu Kacha, PhD Student, Department of Materials Science and Engineering, National Taiwan University of Science and Technology, Taipei 10607, Taiwan; W Z Chang, PhD, Department of Materials Science and Engineering, National Taiwan University of Science and Technology, Taipei 10607, Taiwan; S F Wang, PhD, Department of Materials and Minerals Resources Engineering, National Taipei University of Technology, Taipei 10608, Taiwan; Jinn P Chu, PhD, Department of Materials Science and Engineering, National Taiwan University of Science and Technology, Taipei 10607, Taiwan
11:40
PN-Diode P-Oxide-Semiconductor/N-SiC/N-Si Resistive Nonvolatile Memory for Cross-Point Memory Array
Yoshihiko Sato, B.Sc., Tokyo University of Agriculture & Technology; Atsushi Yamashita, B.Sc., Tokyo University of Agriculture & Technology; Takahiro Tsukamoto, Ph.D., Tokyo University of Agriculture & Technology; Yoshiyuki Suda, Ph.D., Tokyo University of Agriculture & Technology