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Redox-Gated Molecular Memory Devices Based on Dynamic Doping of Polythiophene
Recent references:
(1) Yan, H.; Bergren, A. J.; McCreery, R.; Della Rocca, M. L.; Martin, P.; Lafarge, P.; Lacroix, J. C.; Activationless charge transport across 4.5 to 22 nm in molecular electronic junctions; Proceedings of the National Academy of Sciences 2013, 110, 5326.
(2) McCreery, R.; Yan, H.; Bergren, A. J.; A Critical Perspective on Molecular Electronic Junctions: There is Plenty of Room in the Middle; Phys. Chem. Chem. Phys. 2013, 15, 1065.
(3) Sayed, S. Y.; Fereiro, J. A.; Yan, H.; McCreery, R. L.; Bergren, A. J.; Charge transport in molecular electronic junctions: Compression of the molecular tunnel barrier in the strong coupling regime; Proceedings of the National Academy of Sciences 2012, 109, 11498.
(4) Kumar, R.; Pillai, R. G.; Pekas, N.; Wu, Y.; McCreery, R. L.; Spatially Resolved Raman Spectroelectrochemistry of Solid-State Polythiophene/Viologen Memory Devices; Journal of the American Chemical Society 2012, 134, 14869.