1405
(Invited) Atom Switch Technology for Low-Power Nonvolatile Logic Application
Atom switch is an electrochemical resistive-change device categorized in the cation type [4]. The electrochemical phenomenon is nonvolatile and based on electrolysis of the Cu electrode to produce a precipitation of Cu between the electrodes, which realizing a high ON/OFF conductance ratio. Previously, we reported a replacement of the SRAM-based switch with atom switch integrated in Cu-BEOL (Fig.2) [6]. An elimination of the forming process and high ON/OFF-state reliabilities have been realized by introducing a polymer solid-electrolyte (PSE) [7], a complementary atom switch (CAS) [8] and alloy electrodes [9].
As compared to a two-terminal device, a three-terminal device is advantageous for the logic application since the separation of the programming line and signal transfer line simplifies circuit design and reduces the layout area. In this paper, a three-terminal resistive-change device featuring the resistive-change junctions coupled with the diode-inserted gate is discussed.
References
- R. Nebashi, et al., “A 90nm 12ns 32Mb 2T1MTJ MRAM”, IEEE Solid-State Circuits Conference - Digest of Technical Papers, 8-12 Feb. 2009 Page(s):462 - 463,463a.
- D. Ielmini, et al., “Reliability Impact of Chalcogenide-Structure Relaxation in Phase-Change Memory (PCM) Cells—Part I: Experimental Study”, IEEE Trans. Electron Devices, vol. 56, no. 5, pp. 1070-1077, 2009.
- M. N. Kozicki, et al., “Applications of programmable resistance changes in metal-doped chalcogenides”, Pennington NJ USA: Electrochem. Soc. 298–309 (1999).
- T. Sakamoto, et al., “Nanometer-scale switches using copper sulfide”, Appl. Phys. Lett. 82, 3032, (2003).
- R. Waser and M. Aono, “Nanoionics-based resistive switching memories”, Nature Material, vol.6, pp. 833-839 (2007).
- M. Tada, et al., “Nonvolatile Crossbar Switch using TiOx/TaSiOy Solid-electrolyte”, IEEE Transactions on Electron Devices, vol. 57, no.8, pp.1987-1995, (2010).
- M. Tada, et al.,“Polymer Solid-Electrolyte (PSE) Switch Embedded on CMOS for Nonvolatile Crossbar Switch”, IEEE Transactions on Electron Devices, vol. 58, no. 12, pp.4398-4405, (2011).
- M. Tada, et al.,“Improved Off-state Reliability of Nonvolatile Resistive Switch with Low Programming Voltage”, IEEE Transactions on Electron Devices, vol. 59, no. 9, pp.2357-2362, (2012).
- M. Tada, et al.,“Improved On-state Reliability of Atom Switch Using Alloy Electrodes”, IEEE Transactions on Electron Devices, vol. 60, no. 10, pp.3534-3540, (2013).