225th ECS Meeting (May 11-15, 2014)
May 11 - 15, 2014
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At-A-Glance
Author Index
Dielectric Science and Materials
Monday, May 12, 2014
Monday
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Tuesday
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Wednesday
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08:00-09:25
N3: More-Than-Moore
More-Than-Moore Overview
Union, Ground Level
Chair(s):
Yaw S. Obeng and Andrew Hoff
08:05-10:40
N2: Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability and Manufacturing
High-K Processing and Characterization
Taylor, Ground Level
Chair(s):
D. Bauza and Durga Misra
10:20-11:40
N3: More-Than-Moore
More-Than-Moore Applications
Union, Ground Level
Chair(s):
Yaw S. Obeng and Andrew Hoff
11:00-12:30
N2: Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability and Manufacturing
Ge Interface and Passivation
Taylor, Ground Level
Chair(s):
Johannes Heitmann and H. Joerg Osten
14:00-15:30
N2: Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability and Manufacturing
III-V/High-K Interface
Taylor, Ground Level
Chair(s):
Ivona Z. Mitrovic and Kandabara Tapily
14:00-16:40
N3: More-Than-Moore
More-Than-Moore Devices
Union, Ground Level
Chair(s):
Masahide Goto and Janet Cassard
15:40-16:40
N2: Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability and Manufacturing
Interface Engineering
Taylor, Ground Level
Chair(s):
Aswini K Pradhan and Clement Merckling
Tuesday, May 13, 2014
Monday
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Tuesday
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Wednesday
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08:00-09:30
N2: Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability and Manufacturing
Dielectric Characterization
Taylor, Ground Level
Chair(s):
Yaw S. Obeng and Zhi David Chen
08:00-10:30
N3: More-Than-Moore
More-Than-Moore Technology
Union, Ground Level
Chair(s):
Yiyu Shi and F Levent Degertekin
10:00-12:00
N2: Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability and Manufacturing
Advanced Devices and Integration
Taylor, Ground Level
Chair(s):
Zhi David Chen and Minghwei Hong
14:00-16:00
N3: More-Than-Moore
More-Than-Moore Materials and Processing
Union, Ground Level
Chair(s):
Sylvia Thomas and Yaw S. Obeng
14:00-17:20
N2: Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability and Manufacturing
Memory Devices and Technology
Taylor, Ground Level
Chair(s):
Martin M. Frank and Anabela Veloso
18:00-20:00
N3: More-Than-Moore
N3 More-Than-Moore Poster Session
Grand Foyer, Lobby Level
Wednesday, May 14, 2014
Monday
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Tuesday
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Wednesday
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08:00-10:30
N2: Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability and Manufacturing
Nanostructured Dielectrics and Characterization
Taylor, Ground Level
Chair(s):
Yongxun Liu and Yuan Lin
08:00-10:50
N3: More-Than-Moore
Metrology for More-Than-Moore
Union, Ground Level
Chair(s):
Richard A Allen and Munehiro Tada
11:00-12:00
N2: Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability and Manufacturing
Emerging Devices
Taylor, Ground Level
Chair(s):
Toshihide Nabatame and Takahiro Nagata
14:00-16:10
N2: Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability and Manufacturing
NEMS - MEMS and Sensor Systems
Taylor, Ground Level
Chair(s):
Ajit Khosla, Edward M Sabolsky and Durga Misra
14:00-16:40
N3: More-Than-Moore
Reliability of More-Than-Moore Devices
Union, Ground Level
Chair(s):
Yaw S. Obeng and Sylvia Thomas
18:00-20:00
N2: Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability and Manufacturing
N2 Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability and Manufacturing Poster Session
Grand Foyer, Lobby Level
Chair(s):
Durga Misra, D. Bauza, Yaw S. Obeng and Zhi David Chen