Nanostructured Dielectrics and Characterization

Wednesday, May 14, 2014: 08:00-10:30
Taylor, Ground Level (Hilton Orlando Bonnet Creek)
Chairs:
Yongxun Liu and Yuan Lin
08:00
1379
An Efficient Phase Field Model for Electrostatics in Complex Dielectric Heterostructures
T. Cheng and Y. Wen (U.S. Department of Energy, National Energy Technology Laboratory)
08:20
1380
(Invited) Octadecylphosphonic Acid Self-Assembled Monolayers in Low Voltage Electrowetting-on-Dielectric Systems
M. Mibus, X. Hu, C. Knospe, M. L. Reed, and G. Zangari (University of Virginia)
08:40
1381
(Invited) Fabrication and Dielectric Properties of BaTiO3 Thin Films on Polycrystalline Ni Foils
H. Du, W. Liang, M. Gao, Y. Zhang (University of Electronic Science and Technology of China), C. L. Chen (University of Texas at San Antonio), and Y. Lin (University of Electronic Science and Technology of China)
09:10
1382
Strained Hgte 3D Topological Insulator
P. Ballet (CEA-Leti, Minatec)
09:40
Break
10:00
1383
Development of in Situ Electrochemical Small-Angle Neutron Scattering (eSANS) for Simultaneous Structure and Redox Characterization of Nanoparticles
V. Prabhu, V. Reipa (National Institute of Standards and Technology), P. Bonnesen (Oak Ridge National Laboratory), and A. J. Rondinone (Center for Nanophase Materials Sciences, Oak Ridge National Laboratory)
See more of: N2: Dielectrics for Nanosystems 6: Materials Science, Processing, Reliability and Manufacturing
See more of: Dielectric Science and Materials
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