Nanostructured Dielectrics and Characterization

Wednesday, May 14, 2014: 08:00-10:30
Taylor, Ground Level (Hilton Orlando Bonnet Creek)
Yongxun Liu and Yuan Lin
An Efficient Phase Field Model for Electrostatics in Complex Dielectric Heterostructures
T. Cheng and Y. Wen (U.S. Department of Energy, National Energy Technology Laboratory)
(Invited) Octadecylphosphonic Acid Self-Assembled Monolayers in Low Voltage Electrowetting-on-Dielectric Systems
M. Mibus, X. Hu, C. Knospe, M. L. Reed, and G. Zangari (University of Virginia)
(Invited) Fabrication and Dielectric Properties of BaTiO3 Thin Films on Polycrystalline Ni Foils
H. Du, W. Liang, M. Gao, Y. Zhang (University of Electronic Science and Technology of China), C. L. Chen (University of Texas at San Antonio), and Y. Lin (University of Electronic Science and Technology of China)
Strained Hgte 3D Topological Insulator
P. Ballet (CEA-Leti, Minatec)
Development of in Situ Electrochemical Small-Angle Neutron Scattering (eSANS) for Simultaneous Structure and Redox Characterization of Nanoparticles
V. Prabhu, V. Reipa (National Institute of Standards and Technology), P. Bonnesen (Oak Ridge National Laboratory), and A. J. Rondinone (Center for Nanophase Materials Sciences, Oak Ridge National Laboratory)