Characterization

Wednesday, 8 October 2014: 08:00-09:20
Expo Center, 1st Floor, Universal 17 (Moon Palace Resort)
Chairs:
Andre Stesmans and Eddy Simoen
08:00
1661
(Invited) Positron Annihilation Spectroscopy on Open-Volume Defects in Group IV Semiconductors
J. Slotte, F. Tuomisto, J. Kujala, A. M. Holm, N. Segercrantz, S. Kilpeläinen, K. Kuitunen (Department of Applied Physics, Aalto University), E. Simoen (imec vzw), F. Gencarelli, R. Loo, and Y. Shimura (Imec)
08:40
1662
(Invited) Synchrotron Radiation Based X-ray Microdiffraction of Advanced Semiconductor Materials
A. Sakai (Osaka University)
See more of: P3: High Purity and High Mobility Semiconductors 13
See more of: Electronic Materials and Processing
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