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Single Particle Measurement Technique Using Tweezers-Type Probe for Insertion Materials
In single particle measurement, an optical microscope was set in a globe box filled with dry Ar gas, and a measurement cell was set on this stage. A single particle of target active material was pinched with a tweezers-type probe under microscope observation, and then its electrochemical measurement was carried out. A mixed solvent of ethylene carbonate (EC) and propylene carbonate (PC) (1:1 in volume) containing 1 mol dm-3 LiPF6 was used as an electrolyte solution.
Fig. 2 shows charge-discharge curves of a Si particle measured by using a tweezers-type probe. Typical charge and discharge curves of Si with potential plateaus at around 0.2 V and 0.4 V were observed [4]. When using a needle probe, it was difficult to maintain the contact with Si particle, resulting in poor reproducibility. In contrast, even repeating cycles, the contact between the tweezers-type probe and Si particle could be maintained by using the tweezers-type probe. This result clearly shows the advantage of tweezers-type probe on evaluation of intrinsic electrochemical properties of advanced active materials with large volume changes.
Reference
[1] Kaoru Dokko, Natsuko Nakata, Kiyoshi Kanamura, Journal of Power Sources 189 (2009) 783-785.
[2] Hirokazu Munakata, Bunpei Takemura, Takamitsu Saito, Kiyoshi Kanamura, Journal of Power Sources 217 (2012) 444 – 448.
[3] Kaoru Dokko, Natsuko Nakata, Yushi Suzuki, Kiyoshi Kanamura, J. Phys. Chem. C 114 (2010) 8646-8650.
[4] S. D. Beattie, D. Larcher, M. Morcrette, B. Simon and J.-M. Tarascon, J. Electrochem. Soc. 115 (2008) A158-A163.