In this talk, we will present an approximation of in-situ diagnostic method, by utilizing isotope-assisted time-of-flight secondary ion mass spectrometry (TOF-SIMS). This method is capable of obtaining time-dependent information during SEI growth, even after the growth process has completed. The model battery design includes a Cu electrode, 6Li labeled electrolyte (1M 6LiBF4 in EC:DEC 1:2) and a 7Li metal counter electrode. As SEI grows on the Cu electrode, the 6Li:7Li isotope ratio in the electrolyte decreases due to 6LiBF4 consumption. The time scale of SEI growth thus can be represented by the 6Li:7Li ratio in the SEI, and each 6Li:7Li ratio corresponds to a snapshot during SEI growth. The isotope ratio are measured with TOF-SIMS after harvesting the SEI. With this method, we have found that the SEI portion formed first (higher 6Li:7Li ratio) presents at the electrolyte/SEI interface, and the SEI formed last (lower 6Li:7Li ratio) exists at the SEI/electrode interface. These results also indicate that new SEI forms at the SEI/electrode interface. Further chemistry analyses with TOF-SIMS and XPS show that the portion formed first are mostly organic compounds while the portion formed last are mostly inorganic compounds. This method could also be applied in other fields where growth dynamics are of interest, such as investigating Li dendrite growth.