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Using X-Ray Diffraction and Imaging for the Investigation of Battery Materials: From Bulk Structural Characterization to in Situ and in Operando Measurements

Tuesday, 30 May 2017
Grand Ballroom (Hilton New Orleans Riverside)
F. Masiello, G. Nenert (PANalytical BV), S. Speakman, J. Quinn (PANalytical, Inc.), M. Sommariva, and M. Gateshki (PANalytical BV)
X-ray diffraction and scattering are powerful tools for the study of battery materials.

We describe here X-ray methods which allows the researcher to combine multiple X-ray techniques to obtain a wealth of information about new materials used in battery applications.

By using X-ray diffraction it is possible to identify the different crystallographic phases and quantify the amount of each phase in the bulk material. Moreover, with the Rietveld method it is possible to refine the crystallographic structures of the different materials.

It is also possible to study the battery in situ and in operando. This can be done either in reflection geometry or in transmission geometry. In order to perform the measurement in transmission geometry, more penetrating radiation is required, e.g. Mo or Ag radiation. A newly developed X-ray detector allows for shorter measurement time and/or better quality data thanks to the higher efficiency of the CdTe sensor material.