The precursors used for Zn, O and Ta are diethyl Zn (DEZ), H2O and pentakis-dimethylamido Ta (PDMAT). The targeted % Ta is varied from 2 to 20% by introduction of PDMAT pulse between DEZ and H2O pulses. The electron concentration and the mobility are measured using Hall measurements. A minimum resistivity of 4 mW.cm with carrier density of 9.0x1019 cm-3 and a mobility of 17.7 cm2/V-sec is observed at 2 at% Ta at room temperature. UV-Vis spectroscopy indicates a monotonic increase in bandgap of TZO from 3.2 to 3.4 eV upon addition of Ta. Photoluminescence (PL) shows a quenching of the green band emission of ZnO associated with oxygen defects upon the addition of 2 at% Ta. Upon further Ta addition, a red shifted defect peak appears which is attributed to formation of new Zn vacancies. This data is supported by X-ray photoelectron spectroscopy (XPS), showing removal of O vacancies and a clear Ta-O-Zn bond formation for higher Ta doping. The conductivity of ZnO and 2% Ta doping ZnO behave differently as a function of temperature. TZO have different activation energy compare to pure ZnO. X-ray Diffraction (XRD) and Transmission Electron Microscope (TEM) indicate the crystallinity change with the Ta doping. The results provide a clear understanding on the mechanism of Ta doping in ZnO and its direct impact on vacancies and resulting electronic and optical properties.
Finally, ALD TZO is deposited on flexible glass substrates and inside nanoporous anodic alumina templates to demonstrate formation of transparent conducting electrodes, conformally on a variety of platforms of relevance to electrochemical research.