Thermoelectric Properties & Characterizations of Surmof Thin Films

Tuesday, 3 October 2017: 12:20
Chesapeake F (Gaylord National Resort and Convention Center)
X. Chen (Applied Research Center), Z. M. Hassan (Karlsruhe Institute of Technology (KIT)), E. Redel (Karlsruhe Institute of Technology), and H. Baumgart (Dept. Electrical & Computer Eng., Old Dominion Univ.)
A new class of thermoelectric materials termed surface-anchored (metal-organic frameworks and coordination network compounds) SURMOFs thin films materials will be introduced. SURMOFs thin films demonstrates promising application potential of organic porous thin films in future thermoelectric and electronic devices working highly efficient in the RT (Room Temperature) region. In our first studies we have characterized the Seebeck coefficient of polycrystalline and highly-ordered SURMOF thin films.1,2

Since SURMOFs are highly porous and the size of their pores are highly adjustable, they can be further functionalized and tailored due to their electrical and thermal conductivity properties. SURMOFs can be therefore regarded as tailorable organic Thermoelectric Material of the future. An outlook will be given on their further electronic characterization, Hall measurements and thermal conductivity as well as on first ZT Chip measurements.


1) X. Chen, Z. Wang, P. Lin, K. Zhang, H. Baumgart, E. Redel, C. WÓ§ll, ECS Trans.,75, 119-126 (2016)

2) X. Chen, Z. Wang, Z. M. Hassan, P. Lin, K. Zhang, H. Baumgart, E. Redel, ECS Journal of Solid State Science and Technology, 6, P150-P153 (2017).