Y. Liu (Argonne National Laboratory), D. Gokcen, S. H. Ahn (National Institute of Standards and Technology), N. L. Ritzert (NIST), R. Wang (National Institute of Standards and Technology), E. Gillette (NIST), S. Ambrozik (National Institute of Standards and Technology, NIST), C. Hangarter (NIST), N. Dimitrov (Binghamton University), H. You (Argonne National Laboratory), U. Bertocci, and T. P. Moffat (National Institute of Standards and Technology)

M. Balucani (Rise Technology Srl, Sapienza University of Rome - DIET) and S. Quaranta (Sapienza University of Rome - DIET)

Y. Sun and G. Zangari (University of Virginia)

S. M. Rosa-Ortiz (University of South Florida) and A. Takshi (Electrical Engineering Dept, University of South Florida)