G02 - Nano and Flexible Electronics I

Monday, 14 October 2019: 11:40-12:40
Room 214 (The Hilton Atlanta)
Chairs:
Oscar van der Straten and Christophe Vallée
11:40
Characteristics of Oxide TFT Using Carbon-Doped Ιn2O3 Thin Film Fabricated By Low-Temperature ALD Using Ιn-Etcp and H2O&O3 
R. Kobayashi (Meiji University), T. Nabatame (National Institute for Materials Science), K. Kurishima (National Institute for Materials Science, JSPS Research Fellow PD), T. Onaya (JSPS Research Fellow), A. Ohi (WPI-MANA, National Institute for Materials Science), N. Ikeda, T. Nagata, K. Tsukagoshi (National Institute for Materials Science), and A. Ogura (Meiji University)
12:00
Piezoelectric Response of ZnO Thin Films Grown By Plasma-Enhanced Atomic Layer Deposition
J. Pilz (Graz University of Technology), T. Abu Ali (Graz University of Technology, JOANNEUM RESEARCH), P. Schäffner, B. Stadlober (JOANNEUM RESEARCH), and A. M. Coclite (Graz University of Technology)
12:20
Hydrogen Barrier Properties of Atomic Layer Deposited Al2O3 with Different Oxidants for Ingazno Thin Film Transistor
Y. Lee, T. Nam, S. Seo (Yonsei University), C. H. Lee (Yonsei University, LG Display Co.), J. Y. Yang, D. W. Choi, C. Yoo, H. J. Kim (LG Display Co.), and H. Kim (Yonsei University)