Saft has developed a method which more accurately simulates internal short than other methods via an embedded heater. The advantage of this method is that it can be triggered at any point or operating condition. Cells can be triggered at any position in a module. It is robust and relatively easy to fabricate. It is an aggressive testing method, but so far it has been proven to be the most convenient and reproducible method to estimate the effects caused by short-circuit. It has been tested in designed environment with the products at desired SOC and the results are reliable, reproducible and informative. The method serves as gold standard in Saft to evaluate the safety of our products against internal short-circuit and it is widely used to validate Saft’s design of different cell, module and battery products.