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(Invited) High Write Efficiency in Voltage-Control Spintronics Memory (VoCSM) for Saving Energy Consumption of Nonvolatile Memories

Thursday, 4 October 2018: 11:20
Universal 7 (Expo Center)
Y. Kato, H. Yoda, N. Shimomura, Y. Osawa, K. Koi, S. Oikawa, T. Inokuchi, M. Ishikawa, A. Tiwari, S. Shirotori, M. Shimizu, B. Altansargai, H. Sugiyama, and A. Kurobe (Toshiba Corporation)
MRAM based on spin-transfer-torque (STT) write operations has been intensively developed as a technology for saving energy. During the development of high-density STT-MRAM, issues have arisen that have placed an intrinsic physical limit on the miniaturization of STT-MRAM. Recently, we proposed and developed a voltage-control spintronics memory (VoCSM) that employs the voltage-controlled-magnetic-anisotropy (VCMA) effect for the selection of MTJs and the spin-Hall effect (SHE) for write operations [1]. We achieved high write efficiency in the VoCSM by taking the following approaches: (1) developing a self-aligned VoCSM structure; (2) improving the spin-Hall electrode to have a large spin-Hall angle; and (3) optimizing the magnetic design of the storage layer.

The VoCSM in the present study employs in-plane MTJs. The critical switching current Ic0 in this VoCSM is expressed as follows:

Ic0 ~ (2e/ħ)αMSteff{-(Hk_eff-Hk_eff(V))/2}(wNtN/θSH)

Here, e is the charge of an electron, α is a damping constant, ħ is Planck’s constant divided by 2π, MS is the saturation magnetization, teff is the effective thickness of the storage layer, Hk_eff is the effective perpendicular magnetic anisotropy field, Hk_eff(V) is the variation of Hk_eff by the applied voltage (VMTJ), wN and tN are respectively the width and thickness of the spin-Hall electrode, and θSH is the spin-Hall angle.

Approach (1)

We fabricated a VoCSM consisting of a string of several MTJs on spin-Hall electrodes as shown in Fig. 1. In the self-aligned VoCSM structure, since the width of the spin-Hall electrode and that of the MTJ are same, almost all of the spin-polarized electrons can exert torque on the storage layer. This enabled a large reduction in the Ic of the self-aligned VoCSM [2]. Furthermore, when the spin-Hall electrode was made thinner by using a highly-selective patterning process, Ic was further reduced [3].

Approach (2)

We applied a novel amorphous-TaB/ β-Ta spin-Hall electrode in the VoCSM, as shown in Fig. 1. The amorphous TaB exhibits a large spin-Hall angle (θSH = -0.18) that is twice that of β-Ta, because extrinsic effects likely have a dominant role in the SHE of TaB [4]. We successfully prepared an extremely small magnetic dead layer (DL) of the storage layer with small interface roughness by using the TaB spin-Hall electrode. The estimated interfacial transparency of CoFeB/TaB had a relatively high value of 0.60 due to the extremely small DL.

Approach (3)

In the precessional switching mode for in-plane MTJs as represented in Fig. 1, since the spins in the storage layer precess from in-plane to out-of-plane, increasing Hk_eff has a big impact on lowering Ic. However, the total magnetization MSteff and Hk_eff are correlated significantly with the magnetic design of the device. In particular, although lowering the total magnetization MSteff has the advantage of lowering Ic, it may also have the effect of decreasing the retention Δ. In this study, we were able to maintain the retention Δ by increasing teff (i.e. reducing the size of DL) despite the decreased MS. Consequently, from the perspective of lowering Ic, we successfully achieved factors such as high θSH, self-aligned device structure related to small wNtN, high Hk_eff, low α, and low MS.

Device properties of the VoCSM

By combining the self-aligned fabrication technique with a novel TaB spin-Hall electrode, a quite small value of critical switching current (Ic ~ 79 μA) was achieved despite a relatively large MTJ size (60 nm × 150 nm). We successfully reduced the write current further to 48 μA by the VCMA effect. The write efficiency of the VoCSM without the VCMA effect is about 4 times higher, and furthermore the write efficiency of the VoCSM by using the VCMA effect can reach 8 times higher compared with STT write operations. The VoCSM device also demonstrates high reliability such as a low write error rate (< 1 × 10-8), high endurance (> 1 × 1012 cycles), and large break-down voltage (> 2.5 V). These results indicate that VoCSM could open a path to realizing high-density nonvolatile memories with low power consumption and high-speed read and write operations.

This work was partly supported by the ImPACT Program of the Council for Science, Technology and Innovation (Cabinet Office, Government of Japan).

References

[1] H. Yoda et al., Digests of 62nd IEDM 2016.

[2] S. Shirotori et al., IEEE Transactions on Magnetics 53, 3401104 (2017).

[3] M. Shimizu et al., Digests of IcAUMS 2018.

[4] Y. Kato et al., Digests of MMM 2017.

Fig. 1. Schematic diagram of the self-aligned VoCSM structure with TaB/Ta spin-Hall electrode and cross-sectional high-resolution TEM image of the MTJ.