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SURMOF Based "Designer Solids" for Microelectronic Devices and Thermoelectric Materials Characterization

Tuesday, 2 October 2018
Universal Ballroom (Expo Center)
Z. M. Hassan (Karlsruhe Institute of Technology (KIT)), V. Linseis (Linseis Messgeräte GmbH), H. Reith (IFW Dresden, Dresden, Germany), H. Baumgart (Old Dominion University, ECE Department), and E. Redel (Karlsruhe Institute of Technology)
SURMOF based "Designer Solids" and Organic thin film materials will be presented as non-volatile RRAM Devices. Additionally a fully thermoelectric characterization have been performed on ZT Test Cips (from Linseins Messgeraete GmbH). Thermoeletric Properties and Seebeck measurements of pristine and loaded SURMOF thin films will be presented.
See more of: H07 Poster Session
See more of: H07: Electronic, Thermal, and Electrochemical Properties of Metal Organic Frameworks (MOFs): Technology, Applications, and Emerging Devices 1
See more of: Electronic and Photonic Devices and Systems
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