Y. Mohammed (Old Dominion University), Z. M. Hassan (Karlsruhe Institute of Technology (KIT)), X. Chen (Applied Research Center), A. A. Elmustafa (Old Dominion University), H. Baumgart (Old Dominion University, ECE Department), and E. Redel (IFG (Institute of Functional lnterfaces))

S. Walheim (INT (Institute of Nanotechnology), APH (Institute of Applied Physics), KIT), E. Redel (IFG (Institute of Functional lnterfaces), IFG (institute of Functional Interfaces)), and T. Schimmel (APH (Institute of Applied Physics), INT (Institute of Nanotechnology), KIT)

T. M. Abdel-Fattah (Applied Research Center, Jefferson National Lab) and Z. Messegee (Christopher Newport University)

N. Ogiwara (Kyoto Univesity), H. Kobayashi (JST-PRESTO), and H. Kitagawa (Kyoto University)

Z. M. Hassan (Karlsruhe Institute of Technology (KIT)), X. Chen (Applied Research Center), K. Zhang (Old Dominion University), E. Redel (IFG (Institute of Functional lnterfaces)), and H. Baumgart (Old Dominion University, ECE Department)

D. H. Chen (Karlsruhe Institute of Technology (KIT)), Z. Fu (Karlsruhe Institute of Technology), and E. Redel (IFG (Institute of Functional lnterfaces))

J. Gies, M. Füser, M. Bolte, A. Terfort, and M. Kind (Goethe University Frankfurt)

M. Kumari (Karlsruher Institut für Technologie (KIT)) and E. Redel (IFG (Institute of Functional lnterfaces), Karlsruhe Institute of Technology)

J. Xiu (Fujian Institute of Research on the Structure of Matter) and Z. Fu (Karlsruhe Institute of Technology)

S. Hamer (Christian Albrechts Universität Kiel)

E. Redel (Karlsruhe Institute of Technology), S. Walheim (INT (Institute of Nanotechnology)), T. H. Schimmel (APH (Institute of Applied Physics)), J. Liu (Dalian University of Technology), and C. Wöll (IFG (institute of Functional Interfaces))

Z. M. Hassan (Karlsruhe Institute of Technology (KIT)), V. Linseis (Linseis Messgeräte GmbH), H. Reith (IFW Dresden, Dresden, Germany), H. Baumgart (Old Dominion University, ECE Department), and E. Redel (Karlsruhe Institute of Technology)