In this study each ‘individual’ component of SEI on a Si anode was prepared as a thin film, and the physical, electrochemical, mechanical and structural properties of prepared films were characterized using a variety of analytical equipment including electrochemical impedance spectroscopy, operando X-ray photoelectron spectroscopy, atomic force microscope, Fourier-transform infrared spectroscopy, scanning spreading resistance microscopy and time-of-flight secondary ion mass spectrometry. This study can provide a strong guidance to aid in the development of new electrolytes, additives and binders to stabilize SEI layer on a silicon anode by identifying beneficial components and providing mechanical explanation of a variety of reactions and phenomena in a SEI.
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