Y. M. Chiang (Massachusetts Institute of Technology, 24M Technologies)

N. Takami (Toshiba Corporation), K. Yoshima (Toshiba corporation), and Y. Harada (Toshiba Corporation)

C. Johnson (Center for Electrochemical Energy Storage (CEESII, EFRC), Argonne National Laboratory), C. K. Lin (Argonne National Laboratory, Center for Electrochemical Energy Storage (CEESII, EFRC(), E. Lee (Argonne National Laboratory, Center for Electrochemical Energy Storage (CEESII, EFRC)), X. Su, W. Lu, S. E. Trask, X. Wang, V. A. Maroni (Argonne National Laboratory), Y. Ren (Argonne National Laboratory, Advanced Photon Source), E. E. Alp (Argonne National Laboratory, X-ray Science Division), D. Brown (Northern Illinois University, Department of Physics), M. Krumpelt (Argonne National Laboratory, Center for Electrochemical Energy Storage (CEESII, EFRC)), M. M. Thackeray (Argonne National Laboratory, Argonne), M. K. Y. Chan, A. Kinaci, L. Li (Argonne National Laboratory, Center for Nanoscale Materials), Z. Yao, and C. Wolverton (Northwestern University, Department of Materials Science and Engineering)

Y. S. Hu (Institute of Physics, Chinese Academy of Sciences)

H. Arai, A. Nakata, K. Nishio, and Z. Ogumi (Kyoto University)

H. Mao (YouLion Battery)

M. Quix (Umicore)

J. Diekmann (Technische Universität Braunschweig), C. Hanisch (Lion Engineering GmbH), T. Loellhoeffel (TU Braunschweig), G. Schälicke, and A. Kwade (Technische Universität Braunschweig)