928
Temperature Dependent Instability of Drain Bias Stress in Amorphous Indium-Gallium-Zinc-Oxide Thin Film Transistors

Tuesday, May 14, 2013: 12:00
Spruce, Mezzanine Level (Sheraton)
Geng-Wei Chang , National Chiao Tung University, Kaohsiung, Taiwan
Ting-Chang Chang , National Sun Yat-Sen University
Yong-En Syu , Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
Jhe-Ciou Jhu , National Sun Yat-Sen University
Kuan-Chang Chang , National Sun Yat-Sen University
Tsung-Ming Tsai , National Sun Yat-Sen University
Ya-Hsiang Tai , National Chiao Tung University

Abstract:

See more of: Electronic Devices
See more of: E9: Wide-Bandgap Semiconductor Materials and Devices 14
See more of: Dielectric and Semiconductor Materials, Devices, and Processing
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