955
Surface Degradation of GaN after Thermal Processes

Tuesday, May 14, 2013
Osgoode Ballroom, Lower Concourse Level (Sheraton)
Min-Woo Ha, Ph. D. , Korea Electronics Technology Institute, Seongnam, South Korea
Ogyun Seok, M.S. , Seoul National University
Woojin Ahn, B.S. , Seoul National University, Seoul, South Korea
Min-Koo Han , Seoul National University, Seoul, South Korea

Abstract:

  • E9-0955 (191.9KB) - Abstract Text
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