749
Identification of Deep Levels Associated with Extended and Point Defects in GeSn Epitaxial Layers Using DLTs

Tuesday, May 14, 2013: 11:30
Provincial Ballroom North, Second Floor (Sheraton)
Somya Gupta , IMEC, Belgium, Leuven, Belgium
Eddy Simoen , IMEC, Belgium
Henk Vrielinck , University of Gent, Belgium
Clement Merckling , IMEC, Belgium
Benjamin Vincent , IMEC, Belgium
Federica Gencarelli , IMEC, Belgium
Roger Loo , IMEC, Belgium
Marc Heyns , imec

Abstract:

See more of: Germanium Nanostructures and Devices
See more of: E2: Graphene, Ge/III-V, and Emerging Materials for Post CMOS Applications 5
See more of: Dielectric and Semiconductor Materials, Devices, and Processing
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