746
(Invited) Stress Simulations of Si- and Ge-Channel FinFETs for the 14 nm-Node and Beyond
(Invited) Stress Simulations of Si- and Ge-Channel FinFETs for the 14 nm-Node and Beyond
Tuesday, May 14, 2013: 10:10
Provincial Ballroom North, Second Floor (Sheraton)
Geert Eneman
,
imec, Heverlee, Belgium
David P. Brunco
,
imec
Liesbeth Witters
,
imec
Benjamin Vincent
,
imec
Paola Favia
,
imec
Andriy Hikavyy
,
imec
An De Keersgieter
,
imec
Jerome Mitard
,
imec
Roger Loo
,
imec
Anabela Veloso
,
Imec, Leuven, Belgium
Olivier Richard
,
imec
Hugo Bender
,
imec
Wilfried Vandervorst
,
imec
Matty Caymax
,
imec
Naoto Horiguchi
,
Imec
Nadine Collaert, PhD
,
imec
Aaron Thean
,
imec
Abstract:
- E2-0746 (88.3KB) - Abstract Text