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Performance, Reliability and YIELD Considerations In The Manufacturing Of POWER Electronics Based On SiC and GaN

Wednesday, October 30, 2013: 11:10
Continental 9, Tower 3, Ballroom Level (Hilton San Francisco Union Square)
Rajendra Singh , Clemson University, Clemson, SC
Githin F. Alapatt , Clemson University

Abstract:

See more of: Manufacturing Challenges
See more of: E3: GaN and SiC Power Technologies 3
See more of: Dielectric and Semiconductor Materials, Devices, and Processing
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