Synchrotron X-ray Topography Studies of the Evolution of the Defect Microstructure in Physical Vapor Transport Grown 4H-SiC Single Crystals

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Synchrotron X-ray Topography Studies of the Evolution of the Defect Microstructure in Physical Vapor Transport Grown 4H-SiC Single Crystals

Wednesday, October 30, 2013: 11:30

Continental 9, Tower 3, Ballroom Level (Hilton San Francisco Union Square)

Michael Dudley, B.Sc., Ph.D , Stony Brook University

Balaji Raghothamachar , Stony Brook University

Huanhuan Wang , Stony Brook University

Fangzhen Wu , Stony Brook University

Shayan Byrappa , Stony Brook University

Gil Chung , Dow Corning Compound Semiconductor Solutions

Edward K Sanchez , Dow Corning Compound Semiconductor Solutions

Stephan Mueller , Dow Corning Compound Semiconductor Solutions

Darren Hansen , Dow Corning Compound Semiconductor Solutions

Mark Loboda , Dow Corning Compound Semiconductor Solutions

Abstract: