Flash Memories

Thursday, 9 October 2014: 14:00-15:20
Expo Center, 1st Floor, Universal 5 (Moon Palace Resort)
Chairs:
Kiyoteru Kobayashi and Zia Karim
14:00
2054
(Invited) Multilevel Cell Nonvolatile Memory with Field-effect Transistor Using Crystalline Oxide Semiconductor
T. Matsuzaki, T. Onuki, S. Nagatsuka, H. Inoue, T. Ishizu, H. Miyairi, M. Sakakura, T. Atsumi, Y. Shionoiri, K. Kato, T. Okuda, Y. Yamamoto, J. Koyama, and S. Yamazaki (Semiconductor Energy Laboratory Co., Ltd.)
14:30
2055
(Invited) Defect Generation Mechanism and Its Impact on Reliability Properties in MONOS Devices
S. Fujii, H. Kusai, K. Sakuma, and M. Koyama (Toshiba Corporation)
15:00
2056
Temperature Effect on Memory Functions of the nc-CdSe Embedded ZrHfO High-k MOS Device
S. Zhang and Y. Kuo (Texas A&M University)
See more of: Q5: Nonvolatile Memories
See more of: Electronic and Photonic Devices and Systems
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