Advanced Characterization of Materials Electronic Structure with High Energy-Resolution X-Ray Spectroscopy

Monday, October 12, 2015: 14:00
Curtis A (Hyatt Regency)
D. Sokaras, T. C. Weng (SLAC National Accelerator Laboratory), and D. Nordlund (SLAC National Accelerator Laboratory)
High-resolution hard x-ray spectroscopies (XES, HERFD, RIXS, XRS) are  well-established characterization tools for providing insights of material’s electronic and geometric structure. At SLAC National Accelerator Laboratory we have developed recently a set of high-resolution x-ray spectroscopic capabilities with oustanding throughput and efficiency. These developments have made feasible the routine study of the electronic structure and the ligand environment of metal coordination compounds and active centers in metalloproteins, electrochemical process under in-situ conditions, PV's, as well as studies on catalytic systems under ambient conditions.Representative examples of in-situ application in batteries, electrocatalysis, hydrogen storage, etc. will be presented and discussed from the ongoing spectroscopy programs of Stanford Synchrotron Radiation Lightsource.