Compound Semiconductor Characterization

Monday, October 12, 2015: 14:00-16:00
Curtis A (Hyatt Regency)
Chair:
Travis J Anderson
14:00
Advanced Characterization of Materials Electronic Structure with High Energy-Resolution X-Ray Spectroscopy
D. Sokaras, T. C. Weng (SLAC National Accelerator Laboratory), and D. Nordlund (SLAC National Accelerator Laboratory)
14:40
Terahertz Spectroscopy: Studying Carrier Dynamics in Semiconductor Nanostructures
L. V. Titova (Worcester Polytechnic Institute), S. Xu (University of Alberta), J. M. Baribeau (National Research Council), D. J. Lockwood (National Research Council Canada), and F. Hegmann (University of Alberta)
15:20