Compound Semiconductor Characterization

Monday, October 12, 2015: 14:00-16:00
Curtis A (Hyatt Regency)
Chair:
Travis J Anderson
14:00
1207
Advanced Characterization of Materials Electronic Structure with High Energy-Resolution X-Ray Spectroscopy
D. Sokaras, T. C. Weng (SLAC National Accelerator Laboratory), and D. Nordlund (SLAC National Accelerator Laboratory)
14:40
1208
Terahertz Spectroscopy: Studying Carrier Dynamics in Semiconductor Nanostructures
L. V. Titova (Worcester Polytechnic Institute), S. Xu (University of Alberta), J. M. Baribeau (National Research Council), D. J. Lockwood (National Research Council Canada), and F. Hegmann (University of Alberta)
15:20
1209
Characterization of Compound Semiconductors using Aberration-Corrected Electron Microscopy
D. Smith (Arizona State University Department of Physics)
See more of: H03: State-of-the-Art Program on Compound Semiconductors 58 (SOTAPOCS 58)
See more of: Electronic and Photonic Devices and Systems
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