Non-Destructive High-Resolution Conductivity Mapping of Thin-Film Battery Electrodes
We report a four-line probe that has been used to make high-resolution maps of local electrode conductivity on the micron scale. A computer-controlled apparatus allows precise control of pressure on the sample and positioning of the probe. A significant part of the work was developing a novel hybrid numerical-analytical model to invert the experiment, allowing a separate determination of film conductivity and contact resistance at the current collector in real time on a desktop computer. We will discuss the amount of local conductivity variation within representative electrode films.