ReRAM-1

Wednesday, October 14, 2015: 08:00-09:40
Curtis B (Hyatt Regency)
Chairs:
Hisashi Shima and Shoso Shingubara
08:00
761
(Keynote) Oxide based Resistive Memories for Low Power Embedded Applications and Neuromorphic Systems
E. Vianello, D. Garbin (CEA Leti), N. Jovanovic, O. Bichler (CEA List), O. Thomas (CEA Leti), B. de Salvo (CEA-LETI), and L. Perniola (CEA, LETI, MINATEC Campus)
08:40
762
(Invited) Current Filamentation in Rram As Measured By High Speed Electrical Thermometry
J. A. Bain, A. Sharma (Carnegie Mellon University), and M. Skowronski (Carnegie Mellon University)
09:10
763
(Invited) Improving Memory Performance of Cu/HfO2/Pt Conducting-Bridge RAM by Solvent Substitution
K. Kinoshita (Tottori University)
See more of: D02: Nonvolatile Memories
See more of: Dielectric Science and Materials
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