J. K. Schaeffer III (GLOBALFOUNDRIES)

T. Kojiri, T. Suwa, K. Hashimoto, A. Teramoto, R. Kuroda, and S. Sugawa (Tohoku University)

A. Veloso, E. Altamirano-Sánchez, S. Brus, B. T. Chan, M. Cupak, M. Dehan, C. Delvaux, K. Devriendt, G. Eneman, M. Ercken, T. Huynh-Bao, T. Ivanov, P. Matagne, C. Merckling, V. Paraschiv, S. Ramesh, E. Rosseel, L. Rynders, A. Sibaja-Hernandez, S. Suhard, Z. Tao, E. Vecchio, N. Waldron, D. Yakimets, K. De Meyer (Imec), D. Mocuta, N. Collaert, and A. Thean (imec, Belgium)

L. Gaben (STMicroelectronics, Crolles, France, CEA-LETI MINATEC Campus), S. Barraud (CEA-LETI MINATEC Campus), M. P. Samson (STMicroelectronics, Crolles, France), M. A. Jaud, S. Martinie, O. Rozeau, J. Lacord (CEA-LETI MINATEC Campus), C. Arvet (STMicroelectronics, Crolles, France), C. Vizioz (CEA-LETI MINATEC Campus), J. Bustos (STMicroelectronics, Crolles, France), J. A. Dallery (VISTEC ELECTRON BEAM GmbH), S. Pauliac, V. Balan, C. Euvrard-Colnat, C. Perrot, V. Loup (CEA-LETI MINATEC Campus), P. Besson (Univ. Grenoble Alpes), J. M. Hartmann (Univ. Grenoble Alpes, CEA-LETI, MINATEC Campus), S. Monfray, F. Boeuf, T. Skotnicki (STMicroelectronics), F. Balestra (Grenoble INP-Minatec/CNRS), and M. Vinet (CEA-LETI MINATEC Campus)