The short-term poisoning behavior of high-performance electrolyte-supported Ni/CGO10-based cells was systematically investigated by means of transient voltage stability experiments and electrochemical impedance measurements for a wide range of operating conditions. The effects of temperature (800 – 950 °C) and current density (OCV – 0.75 A·cm‒2) on the extent of sulfur poisoning (1 – 20 ppm H2S) was evaluated. The poisoning behavior was shown to be completely reversible for short exposure times in all cases. By means of equivalent circuit modeling, the chemical capacitance of Ni/CGO10 anodes was demonstrated to be strongly dependent on temperature and gas phase composition reflecting a changing Ce3+/Ce4+ ratio in the CGO phase. Using a model reformate as fuel gas, it was shown that CO can still be electrochemically converted under sulfur exposure.
Furthermore, long-term experiments of 1000 h were conducted at 900 °C and 0.5 A·cm‒2 with and without sulfur exposure and the degradation progress was monitored by impedance spectroscopy. Moreover, comprehensive post-mortem analysis including FIB/SEM, TEM and XRF was carried out in order to identify the nature and location of the occurring microstructural changes.