In this talk, I will begin by reviewing some of the key difficulties associated with predictive modeling of complex interfaces, with specific reference to solid-liquid and solid-solid interfaces in materials for photoelectrochemical water splitting. Next, I will show how ab initio molecular dynamics can be combined with advanced X-ray spectroscopy (XAS, XES, XPS) and other high-fidelity experimental probes to enable more realistic models of surfaces and interfaces in semiconductor photoelectrodes that go beyond idealized approximations. I will review our recent efforts applying this synergistic approach to study the structural, chemical, and transport properties of III/V semiconductor photoelectrodes under electrochemical and photoelectrochemical operation. I will show how theoretical modeling and experimental characterization operate hand-in-hand in this regard, with experiments aiding the validation and assembly of accurate interface models, and theory aiding the interpretation of complex spectra. The examples will specifically highlight the importance of accounting for structural and chemical changes induced by the presence of the interface under electrochemical conditions, such as surface oxidation and reconstruction, which profoundly alter photoelectrode behavior with consequences for photoelectrochemical durability and efficiency.
This work was performed under the auspices of the U.S. Department of Energy by Lawrence Livermore National Laboratory under Contract DE-AC52-07NA27344.