In situ ambient pressure X-ray photoelectron spectroscopy (AP-XPS) was used to evaluate conditions leading to coking using CO/CO2 mixtures at 300 mTorr total pressure at 450 oC. Electrical bias was applied to ceria based films, deposited using pulsed laser deposition on “buried” Pt electrodes, supported on ionic conducting substrates of yttria stabilized zirconia (YSZ) to in situ drive the CO2 reduction reaction. With electrochemical APXPS, we tracked the evolution of surface chemical change during coking reaction on ceria thin film samples with different dopant types (Zr, Gd) and doping concentrations. The surface spectroscopy analysis yielded information about the relationship between onset of coking, surface defect concentration (e.g., oxygen vacancies), surface composition (e.g., relative cation and impurity), and area specific resistance. During CO disproportionation, or coking, surface Ce3+ concentration was only loosely correlated with the deposited carbon intensity and indicated a threshold amount of Ce3+ for coking onset. The observed threshold phenomenon deepens previous understanding of Ce3+ sites’ catalytic role in CO disproportionation since no carbon was observed even considerable surface cerium had been reduced. By combining Monte Carlo simulation, we have shown that the Ce3+−Ce3+ pair formation exhibited similar behavior against surface Ce3+ concentration as coking intensity, indicating that Ce3−Ce3+ pair could be the dominant catalytic structure for coking reaction on ceria surface. These new insights on coking mechanism would be beneficial for rational coking-resistant electrodes design for CO2 electrolysis devices.