C. R. Cabrera Jr. (University of Puerto Rico at Rio Piedras), R. Acevedo (University of Puerto Rico at Río Piedras), C. Morales (university of Puerto Rico at Río Piedras), L. Echegoyen (The University of Texas at El Paso), and R. A. Martínez-Rodríguez (University of Puerto Rico, Rio Piedras Campus)

V. C. Su, K. C. Ho, J. H. Ye, and C. H. Kuan (Graduate Institute of Electronics Engineering, NTU)

M. T. Flavin (Massachusetts Institute of Technology, Charles Stark Draper Laboratory), J. Han (Massachusetts Institute of Technology), and D. Freeman (Charles Stark Draper Laboratory)

W. Chaitree (Florida State University) and E. E. Kalu (Florida A&M University - Florida State University COE)

T. R. Garrick (General Motors, University of South Carolina), C. H. Wilkins, A. T. Pingitore (University of South Carolina), A. Gulledge (INVISTA), B. Benicewicz, and J. W. Weidner (University of South Carolina)

H. I. Ji (California Institute of Technology, Northwestern University), T. Davenport (Northwestern University), and S. M. Haile (California Institute of Technology, Northwestern University)

D. L. Wilson III (The University of Tennessee) and T. A. Zawodzinski Jr. (University of Tennessee, Oak Ridge National Laboratory)

J. Li (Missouri University of Science and Technology), N. Lotfi (Southern Illinois University Edwardsville Edwardsville), R. G. Landers, and J. Park (Missouri University of Science and Technology)