Investigating the Elimination of Oxygen Vacancy and Nitrogen Gap in Hafnium Oxide Films Induced By Different Nitridation Process (Cancelled)

Enhanced Non-Linearity Factor in Ferroelectric Tunnel Junction Based on HfO₂ Heterojunction (Cancelled)

Selfrectifying Memristor Device Based on Polarization Switching and Space Charge Distribution Via External Electric Field

Improvement of Line Width Roughness and Line Edge Roughness for Ultrascaled Finfet Technologies (Cancelled)

The Physical Characterization of Single-Crystalline Chromium Silicide Nanowires Grown By Chemical Vapor Deposition

Reliability Characteristics of Low Dielectric Constant Materials Under Mechanical-Electrical Stress (Cancelled)

Effect of Copper Diffusion in Low Dielectric Constant Dielectrics Under Thermal Stress on Electrical and Reliability Characteristics (Cancelled)

Plasma-Based Copper Etch Process and Reliability

Adjustable Silicon Corner Rounding Radius by Wet Technique

Novel Method for Metal-Insulator-Metal (MIM) Plasma Etching Residue Removal (Cancelled)