Y. Xia (Georgia Institute of Technology)

B. J. Wiley, M. J. Kim, and S. Alvarez (Duke University)

J. E. Millstone (University of Pittsburgh)

T. P. Moffat (NIST), Y. Liu (Lam Research Corporation), S. H. Ahn (National Institute of Standards and Technology), N. L. Ritzert (Theiss Research/NIST), R. Wang (Argonne National Laboratory), E. Gillette (University of Maryland), D. Gokcen (National Institute of Standards and Technology), C. Hangarter (U.S. Naval Research Laboratory), H. Tan (NIST, Gaithersburg, MD, USA), L. Bendersky (NIST), H. You (Argonne National Laboratory), and U. Bertocci (National Institute of Standards and Technology)