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(Digital Presentation) Two-Step Wet Clean for HKMG TiAl Protection and Polymer-Free

Tuesday, 31 May 2022: 16:00
West Meeting Room 113 (Vancouver Convention Center)
T. Chen, W. Tu, and H. Zhang (Semiconductor Manufacturing International Corporation)
In this paper, a two-step clean method for HKMG TiAl protection is discussed, which could improve TiAl damage and make etch-polymer clean. Using Dupont’s EKC580 chemical before traditional HF clean, the TiAl form TiOx protection layer on the surface, then HF cleans etch by-product polymer. The TiAl loss by HF can improve from 37A to 6A after EKC580 clean. The yield performance is hence much improved.