P. Hashemi, T. Ando (IBM T. J. Watson Research Center), E. A. Cartier (IBM Research), J. Bruley (IBM T. J. Watson Research Center), C. H. Lee (IBM Research), and V. Narayanan (IBM T. J. Watson Research Center)
S. Komago, T. Murakami, K. Yoshioka (Meiji University), R. Yokogawa (JSPS Research Fellow, Meiji University), J. O. Borland (J.O.B. Technologies), T. Kuroi (Nissin Ion Equipment, Kyoto, Japan), T. Tabata, K. Huet (SCREEN-LASSE, Gennevilliers, France), N. Horiguchi (IMEC, Leuven, Belgium), and A. Ogura (Meiji University)
L. Žurauskaitė (KTH Royal Institute of Technology), L. Jones, V. R. Dhanak, I. Z. Mitrovic (University of Liverpool), P. E. Hellström, and M. Östling (KTH Royal Institute of Technology)
