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Comparative Experimental Study between Tensile and Compressive Uniaxially Stressed nMuGFETs under X-ray Radiation Focusing on Analog Behavior

Tuesday, May 14, 2013: 14:20
Dominion Ballroom North, Second Floor (Sheraton)
V. V. Peruzzi , Centro Universitário da FEI
S. P. Gimenez , Centro Universitário da FEI
Paula Ghedini Der Agopian , Centro Universitário da FEI, Sao Paulo, Brazil
Marcilei A.G. Silveira , Centro Universitário da FEI
Joao Antonio Martino , University of Sao Paulo, Sao Paulo, Brazil
Eddy Simoen , imec
Cor Claeys , K.U. Leuven

Abstract:

See more of: Strain Technology and Characterization
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