855
(Electronics & Photonics Division Award Presentation) Si-SiO2 Interface to High-K-Ge/III-V Interface: Passivation and Reliability

Monday, May 13, 2013: 14:00
Norfolk, Mezzanine Level (Sheraton)
Durga Misra, Ph.D. , New Jersey Institute of Technology, Newark, NJ

Abstract:

  • E5-0855 (669.3KB) - Abstract Text
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