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A Two-Step Electrical Degradation Behavior in α-InGaZnO Thin-Film Transistor

Tuesday, October 29, 2013
Grand Ballroom, Tower 2, Grand Ballroom Level (Hilton San Francisco Union Square)
Tung-Ming Pan, Ph.D. , Chang Gung University, Taoyuan, Taiwan
Fa-Hsyang Chen, M.D. , Chang Gung University
Ching-Hung Chen , Chang Gung University
Ching-Chang Lin, M.D. , National Chiao Tung University
Chieh Cheng , National Chiao Tung University, Hsinchu City, Taiwan
Fu-Hsiang Ko, Ph.D. , National Chiao Tung University
Wu-Hsiung Lin, Ph.D. , AU Optronics
Po-Hsueh Chen, M.D. , AU Optronics
Jim-Long Her, Ph.D. , Chang Gung University
Yasuhiro H. Matsud, Ph.D. , University of Tokyo

Abstract:

See more of: E10 Poster Session
See more of: E10: Semiconductors, Dielectrics, and Metals for Nanoelectronics 11
See more of: Dielectric and Semiconductor Materials, Devices, and Processing
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