2016
CdSe Embedded ZrHfO Gate Dielectric Nonvolatile Memories – Charge Trapping and Breakdown Studies

Thursday, October 31, 2013: 11:20
Golden Gate 1, Tower 3, Lobby Level (Hilton San Francisco Union Square)
Chi-Chou Lin , Texas A&M University
Yue Kuo , Texas A&M University, College Station, TX

Abstract:

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