2015
Optimized Contact Engineering to Maximize Cell Current in NAND Flash Memory Technology

Thursday, October 31, 2013: 11:00
Golden Gate 1, Tower 3, Lobby Level (Hilton San Francisco Union Square)
Joong Ho Yoon , Samsung Electronics Co. LTD, Hwasung, Wales
Hong-Sig Kim , Samsung Electronics Co., Ltd
Yung Sam Kim , Samsung Electronics Co. LTD
Jun Kyoung Lee , Samsung Electronics Co. LTD
Eui Sung Han , Samsung Electronics Co. LTD
YeonUn Jeong , Samsung Electronics Co. LTD
Young Ik Lee , Samsung Electronics Co. LTD
Sung Jin Jang , Samsung Electronics Co. LTD
Hyun Gil Kim , Samsung Electronics Co. LTD
Sung Wook Park , Samsung Electronics Co. LTD
Sae Hui Park , Samsung Electronics Co. LTD
Hae-Bum Lee, Ph.D. , Samsung Electronics Co., Ltd
Kyu-Pil Lee, Ph.D. , Samsung Electronics Co., Ltd
In-soo Cho , Samsung Electronics Co. LTD.

Abstract:

  • E5-2015 (469.1KB) - Abstract Text