2014
(Invited) Improved Operation Characteristics in Charge-Trapping Flash Memory Devices with Engineered Dielectric Stack and SiGe Channel

Thursday, October 31, 2013: 10:30
Golden Gate 1, Tower 3, Lobby Level (Hilton San Francisco Union Square)
Zong-Hao Ye, MS , National Tsing Hua University
Li-Jung Liu, PhD , National Tsing Hua University
Kuei-Shu Chang-Liao, PhD , National Tsing Hua University, Hsinchu, Taiwan

Abstract:

See more of: Flash Memories
See more of: E5: Nonvolatile Memories
See more of: Dielectric and Semiconductor Materials, Devices, and Processing
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