2171
Photo-Bias Instability of Solution Processed Zinc Tin Oxide Thin Film Transistors With Varying Zn:Sn Composition Ratio

Tuesday, October 29, 2013
Grand Ballroom, Tower 2, Grand Ballroom Level (Hilton San Francisco Union Square)
Yoon Jang Kim , Seoul National University, Seoul, South Korea
Bong Seob Yang , Seoul National University
Seungha Oh , Seoul National University
Sang Jin Han , Seoul National University
Hyeong Joon Kim , Seoul National University, Seoul, South Korea

Abstract:

See more of: E10 Poster Session
See more of: E10: Semiconductors, Dielectrics, and Metals for Nanoelectronics 11
See more of: Dielectric and Semiconductor Materials, Devices, and Processing
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