2006
		Temperature Dependence of Resistance in Conductive Filament Formed With Dielectric Breakdown of Ni/TiO2/Pt Structure
	
					
	
	Temperature Dependence of Resistance in Conductive Filament Formed With Dielectric Breakdown of Ni/TiO2/Pt Structure
	Wednesday, October 30, 2013
	Grand Ballroom, Tower 2, Grand Ballroom Level (Hilton San Francisco Union Square)
	
	
	
	Abstract:
- E5-2006 (135.4KB) - Abstract Text
