2006
Temperature Dependence of Resistance in Conductive Filament Formed With Dielectric Breakdown of Ni/TiO2/Pt Structure
Temperature Dependence of Resistance in Conductive Filament Formed With Dielectric Breakdown of Ni/TiO2/Pt Structure
Wednesday, October 30, 2013
Grand Ballroom, Tower 2, Grand Ballroom Level (Hilton San Francisco Union Square)
Abstract:
- E5-2006 (135.4KB) - Abstract Text